JOPSS - Search Results

Search Results: Records 1-6 displayed on this page of 6

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Journal Articles

A System for ultra-fast transient ion and pulsed laser current microscopies as a function of temperature

Laird, J. S.; Hirao, Toshio; Onoda, Shinobu*; Mori, Hidenobu*; Ito, Hisayoshi

Solid State Phenomena Vol.78-79, p.401 - 406, 2001/07

no abstracts in English

Journal Articles

Development of the ultra-fine ion microbeam apparatus, 2

Ishii, Yasuyuki; Isoya, Akira*; Arakawa, Kazuo; Tanaka, Ryuichi*

JAERI-Conf 2000-019, p.117 - 120, 2001/02

https://jopss.jaea.go.jp/pdfdata/JAERI-Conf-2000-019.pdf

no abstracts in English

Journal Articles

Development of the Ultra-fine microbeam apparatus

Ishii, Yasuyuki; Isoya, Akira*; Tanaka, Ryuichi

F-113-'98/NIES, p.105 - 108, 1998/00

no abstracts in English

Journal Articles

Effects of ion beam irradiation on semiconductor devices

Nashiyama, Isamu; Hirao, Toshio; Ito, Hisayoshi; Oshima, Takeshi

JAERI-Conf 97-003, p.22 - 25, 1997/03

no abstracts in English

Journal Articles

Single-event current transients induced by high energy ion microbeams

Nashiyama, Isamu; Hirao, Toshio; Kamiya, Tomihiro; *; Nishijima, Toshiji*; *

IEEE Transactions on Nuclear Science, 40(6), p.1935 - 1940, 1993/12

https://doi.org/10.1109/23.273461

Times Cited Count：75 Percentile：97.87(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Error prevention of space

Nashiyama, Isamu

EMC: electro magnetic compatibility: solution technology: Denji Kankyo Kogaku Joho, (58), p.70 - 75, 1993/02

no abstracts in English